{"id":57254,"date":"2025-11-28T12:02:25","date_gmt":"2025-11-28T11:02:25","guid":{"rendered":"https:\/\/grupoalava.rearmachine.com\/producto\/ellipsometry\/"},"modified":"2026-06-11T11:01:46","modified_gmt":"2026-06-11T09:01:46","slug":"ellipsometry","status":"publish","type":"product","link":"https:\/\/grupoalava.rearmachine.com\/en\/ingenieros\/producto\/nanotechnology-and-materials\/ellipsometry\/","title":{"rendered":"Ellipsometry"},"content":{"rendered":"<p><div class=\"fusion-fullwidth fullwidth-box fusion-builder-row-1 fusion-flex-container has-pattern-background has-mask-background nonhundred-percent-fullwidth non-hundred-percent-height-scrolling\" style=\"--awb-border-radius-top-left:0px;--awb-border-radius-top-right:0px;--awb-border-radius-bottom-right:0px;--awb-border-radius-bottom-left:0px;--awb-background-color:#f8fafd;--awb-flex-wrap:wrap;\" ><div class=\"fusion-builder-row fusion-row fusion-flex-align-items-stretch fusion-flex-content-wrap\" style=\"max-width:calc( 1250px + 30px );margin-left: calc(-30px \/ 2 );margin-right: calc(-30px \/ 2 );\"><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-0 fusion_builder_column_1_1 1_1 fusion-flex-column\" style=\"--awb-bg-size:cover;--awb-width-large:100%;--awb-margin-top-large:0px;--awb-spacing-right-large:0px;--awb-margin-bottom-large:20px;--awb-spacing-left-large:0px;--awb-width-medium:100%;--awb-order-medium:0;--awb-spacing-right-medium:0px;--awb-spacing-left-medium:0px;--awb-width-small:100%;--awb-order-small:0;--awb-spacing-right-small:15px;--awb-spacing-left-small:15px;\" data-scroll-devices=\"small-visibility,medium-visibility,large-visibility\"><div class=\"fusion-column-wrapper fusion-column-has-shadow fusion-flex-justify-content-flex-start fusion-content-layout-column\"><div class=\"fusion-text fusion-text-1\"><p style=\"font-size: 16px;\" data-fusion-font=\"true\">Alava Ingenieros offers the most suitable technique for the characterization of thin films. Spectroscopic ellipsometry is a surface-sensitive, non-destructive and non-intrusive optical technique widely used for the characterization of thin films and surfaces. It is based simply on the change of polarization state of light when reflected obliquely from a thin film. Depending on the type of material, spectroscopic ellipsometers can measure thicknesses from a few Angstroms to several microns. It is also a good technique for measuring multilayers.    <\/p>\n<p style=\"font-size: 16px;\" data-fusion-font=\"true\">Spectroscopic ellipsometry allows characterization of a wide range of thin film properties, such as layer thickness, thin film properties, such as layer thickness, optical properties (n,k), optical bandwidth, layer interface and roughness, film composition, depth and area uniformity, etc.<\/p>\n<\/div><\/div><\/div><\/div><\/div><div class=\"fusion-fullwidth fullwidth-box fusion-builder-row-2 fusion-flex-container has-pattern-background has-mask-background nonhundred-percent-fullwidth non-hundred-percent-height-scrolling\" style=\"--awb-border-radius-top-left:0px;--awb-border-radius-top-right:0px;--awb-border-radius-bottom-right:0px;--awb-border-radius-bottom-left:0px;--awb-flex-wrap:wrap;\" ><div class=\"fusion-builder-row fusion-row fusion-flex-align-items-flex-start fusion-flex-content-wrap\" style=\"max-width:calc( 1250px + 30px );margin-left: calc(-30px \/ 2 );margin-right: calc(-30px \/ 2 );\"><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-1 fusion_builder_column_2_3 2_3 fusion-flex-column\" style=\"--awb-bg-size:cover;--awb-width-large:66.666666666667%;--awb-margin-top-large:0px;--awb-spacing-right-large:15px;--awb-margin-bottom-large:20px;--awb-spacing-left-large:15px;--awb-width-medium:66.666666666667%;--awb-order-medium:0;--awb-spacing-right-medium:15px;--awb-spacing-left-medium:15px;--awb-width-small:100%;--awb-order-small:0;--awb-spacing-right-small:15px;--awb-spacing-left-small:15px;\"><div class=\"fusion-column-wrapper fusion-column-has-shadow fusion-flex-justify-content-flex-start fusion-content-layout-column\"><div class=\"fusion-text fusion-text-2\"><p style=\"font-size: 16px;\" data-fusion-font=\"true\">The materials that can be analyzed by ellipsometry are various and have different characteristics, including semiconductors, polymers, dielectrics, organic compounds and metals, etc. Ellipsometry can also be used to study the solid-liquid or liquid-liquid interface. <\/p>\n<p style=\"font-size: 16px;\" data-fusion-font=\"true\">HORIBA spectroscopic ellipsometers use innovative technology to perform high-frequency polarization modulation measurements without any mechanical movement, providing faster characterization, wider range and higher accuracy compared to conventional ellipsometers.<\/p>\n<\/div><\/div><\/div><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-2 fusion_builder_column_1_3 1_3 fusion-flex-column\" style=\"--awb-bg-size:cover;--awb-width-large:33.333333333333%;--awb-margin-top-large:0px;--awb-spacing-right-large:15px;--awb-margin-bottom-large:20px;--awb-spacing-left-large:15px;--awb-width-medium:33.333333333333%;--awb-order-medium:0;--awb-spacing-right-medium:15px;--awb-spacing-left-medium:15px;--awb-width-small:100%;--awb-order-small:0;--awb-spacing-right-small:15px;--awb-spacing-left-small:15px;\"><div class=\"fusion-column-wrapper fusion-column-has-shadow fusion-flex-justify-content-flex-start fusion-content-layout-column\"><div class=\"fusion-image-element\" style=\"--awb-caption-title-font-family:var(--h2_typography-font-family);--awb-caption-title-font-weight:var(--h2_typography-font-weight);--awb-caption-title-font-style:var(--h2_typography-font-style);--awb-caption-title-size:var(--h2_typography-font-size);--awb-caption-title-transform:var(--h2_typography-text-transform);--awb-caption-title-line-height:var(--h2_typography-line-height);--awb-caption-title-letter-spacing:var(--h2_typography-letter-spacing);\"><span class=\" fusion-imageframe imageframe-none imageframe-1 hover-type-none\"><img decoding=\"async\" width=\"300\" height=\"164\" alt=\"SmartSE\" title=\"csm_Smart-SE-HORIBA_\" src=\"https:\/\/grupoalava.rearmachine.com\/wp-content\/uploads\/2025\/11\/csm_Smart-SE-HORIBA_-300x164.webp\" class=\"img-responsive wp-image-57257\" srcset=\"https:\/\/grupoalava.rearmachine.com\/wp-content\/uploads\/2025\/11\/csm_Smart-SE-HORIBA_-200x110.webp 200w, https:\/\/grupoalava.rearmachine.com\/wp-content\/uploads\/2025\/11\/csm_Smart-SE-HORIBA_-400x219.webp 400w, https:\/\/grupoalava.rearmachine.com\/wp-content\/uploads\/2025\/11\/csm_Smart-SE-HORIBA_-600x329.webp 600w, https:\/\/grupoalava.rearmachine.com\/wp-content\/uploads\/2025\/11\/csm_Smart-SE-HORIBA_-800x438.webp 800w, https:\/\/grupoalava.rearmachine.com\/wp-content\/uploads\/2025\/11\/csm_Smart-SE-HORIBA_.webp 1200w\" sizes=\"(max-width: 768px) 100vw, 600px\" \/><\/span><\/div><\/div><\/div><\/div><\/div><div class=\"fusion-fullwidth fullwidth-box fusion-builder-row-3 fusion-flex-container has-pattern-background has-mask-background nonhundred-percent-fullwidth non-hundred-percent-height-scrolling\" style=\"--awb-border-radius-top-left:0px;--awb-border-radius-top-right:0px;--awb-border-radius-bottom-right:0px;--awb-border-radius-bottom-left:0px;--awb-flex-wrap:wrap;\" ><div class=\"fusion-builder-row fusion-row fusion-flex-align-items-flex-start fusion-flex-content-wrap\" style=\"max-width:calc( 1250px + 30px );margin-left: calc(-30px \/ 2 );margin-right: calc(-30px \/ 2 );\"><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-3 fusion_builder_column_1_1 1_1 fusion-flex-column\" style=\"--awb-bg-size:cover;--awb-width-large:100%;--awb-margin-top-large:0px;--awb-spacing-right-large:15px;--awb-margin-bottom-large:20px;--awb-spacing-left-large:15px;--awb-width-medium:100%;--awb-order-medium:0;--awb-spacing-right-medium:15px;--awb-spacing-left-medium:15px;--awb-width-small:100%;--awb-order-small:0;--awb-spacing-right-small:15px;--awb-spacing-left-small:15px;\"><div class=\"fusion-column-wrapper fusion-column-has-shadow fusion-flex-justify-content-flex-start fusion-content-layout-column\"><div class=\"fusion-text fusion-text-3\"><h5><strong>AutoSE<\/strong><\/h5>\n<p style=\"font-size: 16px;\" data-fusion-font=\"true\">This is a spectroscopic ellipsometer for characterization in industrial processes. It is a very easy to use equipment, which allows to automate analysis, so that the operator only has to place the sample, press a button and directly obtain a result easy to understand and without further post-processing. <\/p>\n<h5 style=\"font-size: 16px;\" data-fusion-font=\"true\"><strong>SmartSE<\/strong><\/h5>\n<p style=\"font-size: 16px;\" data-fusion-font=\"true\">A powerful, economical and easy to use equipment. The SmartSE is the entry level equipment of the ellipsometry range offered by Alava Ingenieros, an economical equipment, which allows fast and accurate measurements, from a few Angstroms up to 20 microns. It covers a range from 450 to 1000nm, and allows to add multiple options, such as full automation, Matrix Mueller, etc.  <\/p>\n<h5 style=\"font-size: 16px;\" data-fusion-font=\"true\"><strong>UviselPlus<\/strong><\/h5>\n<p style=\"font-size: 16px;\" data-fusion-font=\"true\">The UVISEL Plus ellipsometer offers the best combination of modularity and performance for advanced characterization of thin films, surfaces and interfaces.<\/p>\n<p style=\"font-size: 16px;\" data-fusion-font=\"true\">The new UVISEL Plus includes the latest acquisition technology designed to measure faster and more accurately than ever before. FastAcq, the latest acquisition technology is based on dual modulation and is designed for real-world thin film characterization. Based on new electronics, data processing and high-speed monochromator, the new FastAcq technology allows a sample measurement from 190 to 2100 nm to be completed in 3 minutes, with high resolution.  <\/p>\n<p style=\"font-size: 16px;\" data-fusion-font=\"true\">Designed to offer greater flexibility in thin film measurements, the UVISEL Plus offers patterned sample microdots, variable angle, automatic mapping platform and a variety of accessories, making it upgradeable to meet all your application and budget needs.<\/p>\n<p style=\"font-size: 16px;\" data-fusion-font=\"true\">The modular design of the UVISEL Plus allows it to be used as a benchtop metrology tool or for on-site integration into process chambers or production tape machines.<\/p>\n<\/div><\/div><\/div><\/div><\/div><\/p>\n","protected":false},"excerpt":{"rendered":"<p>As part of the solutions offered by Alava Ingenieros, spectroscopic ellipsometry is a non-destructive optical technique that allows characterizing the thickness of thin layers and surfaces. Depending on the type of material being measured, this technique allows measurements from a few Angstrom to several tens of microns. It is an essential technique in semiconductor manufacturing, and with a wide range of products, Alava Ingenieros provides desktop solutions for R&#038;D to automated solutions for production.  <\/p>\n","protected":false},"featured_media":57256,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false},"product_brand":[],"product_cat":[7873,8124,8141],"product_tag":[8127],"class_list":["post-57254","product","type-product","status-publish","has-post-thumbnail","product_cat-engineers","product_cat-nanotechnology-and-materials","product_cat-nanotechnology","product_tag-nanotechnology","first","instock","shipping-taxable","product-type-simple"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v28.2 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Ellipsometry - Grupo \u00c1lava<\/title>\n<meta name=\"description\" content=\"Optical and digital microscopy from Motic Europe, combining high optical precision, advanced digital technology and intuitive software.\" \/>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Ellipsometry - 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