{"id":57345,"date":"2025-11-25T13:55:49","date_gmt":"2025-11-25T12:55:49","guid":{"rendered":"https:\/\/grupoalava.rearmachine.com\/producto\/gd-oes-spectrometry\/"},"modified":"2026-06-11T11:10:47","modified_gmt":"2026-06-11T09:10:47","slug":"gd-oes-spectrometry","status":"publish","type":"product","link":"https:\/\/grupoalava.rearmachine.com\/en\/ingenieros\/producto\/nanotechnology-and-materials\/gd-oes-spectrometry\/","title":{"rendered":"GD-OES Spectrometry"},"content":{"rendered":"

Plasma optical emission spectroscopy (GD-OES) is an advanced analytical technique that allows elemental analysis and characterization of materials. \u00c1lava Ingenieros offers Horiba Scientific’s technology for GD-OES spectrometers that provide fast and accurate results in various industrial and research applications. <\/p>\n

What is GD-OES spectrometry?<\/strong>
\nPlasma optical emission spectroscopy (GD-OES) uses an electrical discharge in a low-pressure gas, usually argon (Ar), to produce a plasma to analyze the composition of materials. This process is performed between two electrodes in contact, in vacuum and in contact with the argon. <\/p>\n

Basic principles of GD-OES<\/strong><\/p>\n

    \n
  • Ionization of argon: the electrical discharge ionizes the argon, creating a plasma that generates a current flow between the electrodes.<\/li>\n
  • Sample atomization: argon ions impact the sample surface, atomizing its components.<\/li>\n
  • Excitation and ionization: the atoms of the sample are excited and ionized, emitting photons at characteristic wavelengths.<\/li>\n
  • Photon detection: these photons are detected and analyzed to identify and quantify the elements present in the sample.<\/li>\n<\/ul>\n

    Advantages of GD-OES Spectrometry<\/strong><\/p>\n

      \n
    • High depth resolution: allows investigation from a few nm to more than 150 microns deep, with a depth resolution of up to 1 nm.<\/li>\n
    • Speed and ease of use: it is an extremely fast and easy to handle technique, suitable for routine and research analysis.<\/li>\n
    • Simultaneous analysis: allows the simultaneous analysis of all the elements of interest, which improves the efficiency of the analytical process.<\/li>\n
    • Horiba Scientific GD-OES instruments
      \nHoriba Scientific offers GD-OES spectrometers designed to meet the needs of elemental analysis and in-depth profiling of conductive and non-conductive samples. These instruments are ideal for applications in the materials industry, metallurgy, semiconductor and more. <\/li>\n<\/ul>\n

      GD-Profiler 2\u2122<\/strong>
      \nThe GD-Profiler 2\u2122 is one of Horiba Scientific’s featured products in the GD-OES spectrometer category. This instrument offers fast and simultaneous analysis of all elements of interest, including light elements such as Na, Li, H, \u00b2H, O and Cl. <\/p>\n

      GD-Profiler 2\u2122 features:<\/strong><\/p>\n

        \n
      • Fast and accurate analysis: provides fast and accurate results, improving laboratory efficiency.<\/li>\n
      • Versatility: suitable for a wide range of applications, from surface analysis to in-depth profiling.<\/li>\n
      • Ease of use: intuitive design for easy operation, even for non-expert users.<\/li>\n
      • Applications of GD-OES spectrometry
        \nThe GD-OES technique is used in various industrial and research applications due to its ability to provide detailed and accurate analysis of the elemental composition and depth profiles of materials.<\/li>\n<\/ul>\n

        Some of the most common applications include:<\/span><\/p>\n

          \n
        • Materials industry: analysis of the composition and quality of alloys, coatings and composite materials.<\/li>\n
        • Metallurgy: study of the surface and in-depth properties of metals and alloys.<\/li>\n
        • Semiconductors: characterization of semiconductor materials and devices.<\/li>\n
        • Research and development: analysis of new materials and manufacturing processes.<\/li>\n<\/ul>\n<\/div><\/div><\/div><\/div><\/div>\n","protected":false},"excerpt":{"rendered":"

          HORIBA Scientific’s GD-OES spectroscopy, a leader in elemental analysis and depth profiling, offers advanced equipment such as the GD-Profiler 2\u2122. This technique uses an argon plasma to ionize and excite atoms in the sample, providing fast and accurate analysis up to 150 microns deep with 1 nm resolution. Ideal for many types of materials, with a focus on metallurgy and semiconductor industries, HORIBA stands out for its innovation and precision in the analysis of elemental composition and surface characteristics. <\/p>\n","protected":false},"featured_media":57346,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false},"product_brand":[],"product_cat":[7873,8124,8141],"product_tag":[8127,8160],"class_list":["post-57345","product","type-product","status-publish","has-post-thumbnail","product_cat-engineers","product_cat-nanotechnology-and-materials","product_cat-nanotechnology","product_tag-nanotechnology","product_tag-spectroscopy","first","instock","shipping-taxable","product-type-simple"],"acf":[],"yoast_head":"\nGD-OES Spectrometry - Grupo \u00c1lava<\/title>\n<meta name=\"description\" content=\"HORIBA Scientific's GD-OES spectroscopy, a leader in elemental analysis and in-depth profiling, offers advanced equipment such as the GD-Profiler 2\u2122, which uses an argon plasma to ionize and excite atoms in the sample, providing fast and accurate analysis up to 150 microns deep with 1 nm resolution. Ideal for many types of materials, with a focus on metallurgy and semiconductor industries.\" \/>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"GD-OES Spectrometry - Grupo \u00c1lava\" \/>\n<meta property=\"og:description\" content=\"HORIBA Scientific's GD-OES spectroscopy, a leader in elemental analysis and in-depth profiling, offers advanced equipment such as the GD-Profiler 2\u2122, which uses an argon plasma to ionize and excite atoms in the sample, providing fast and accurate analysis up to 150 microns deep with 1 nm resolution. 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